+41 21 8699033
info@lot-qd.ch
Language
Language :
Deutsch
Français
Italiano
English
Home
Products
Service
News
Latest updates
Product & application news - Spectrum
About us
Newsletter
Events
Contact
Sitemap
Language
Language :
Deutsch
Français
Italiano
English
Home
Newsletter
Events
Contact
Sitemap
Products
Materials science
Very-low resistance measurements
Systems to measure physical properties
Magnetometers
Magnetic field platform
Nanoindenters - Nanohardness tester
Photo lithography systems
Systems for solar cell characterization
Particle size analyzer
Furnace for crystal fabrication
Langmuir-Blodgett systems
Contact angle meters & tensiometers
Dip coater
Spin coater
Flexus thin film stress measurement systems
FP profiler for large format samples
Spectroscopic ellipsometers
QCM-D Quartz Crystal Microbalance
Spectroscopy
Low-temperature Raman microscope
Hyperspectral cameras
Hyperspectral remote sensing systems
Hyperspectral systems
Spectrographs
Spectroscopic ellipsometers
Cameras and detectors for time-resolved spectroscopy and imaging
UV-NIR Spectroradiometer
Carbon nanotubes
Detectors for modular spectroscopy
Imaging spectrographs
Modular optical spectroscopy
Imaging
Cameras and detectors for time-resolved imaging and spectroscopy
Cameras for EUV, X-ray and high-energy particle detection
CCD, EMCCD and sCMOS cameras for imaging
Highest speed cameras
High-speed infrared cameras
Mid and longwave infrared cameras
Near infrared and shortwave infrared cameras
Thermographic NDT and NDE
Visible range infrared cameras
Hyperspectral cameras
Hyperspectral remote sensing systems
Hyperspectral systems
Imaging spectrographs
Light measurement
Electron microscopy
AFSEM - correlative AFM and SEM
Accessories for SEM applications
Cryo preparation system for scanning electron microscopy
Detectors for SEM applications
In situ stages for electron microscopy and µXCT
In situ TEM solutions
Sample preparation for electron microscopy
Sputter & carbon coaters
Cryogenics
Cryogenic temperature control
Cryostats
Helium gas purifiers
Helium liquefiers
Helium recovery and liquefaction plants
Optical cryostats
Optics
Colored glass filters & sets
Wire-grid polarizer UV-IR
Quartz lenses & glass lenses
Beamsplitters
Bandpass filters
Filters for fluorescence and Raman spectroscopy
Neutral density filters
Short and longpass filters
Astronomy/UVBRI filters
Heat control filters
Dichroic filters & sets
Infrared filters
Filter accessories
Light & lasers
Light sources for scientific applications
Light measurement
Laser power measurements
Laser beam diagnostics
Life sciences
Filters for fluorescence analytics
High-throughput cellular imagers
Optical tweezers
QCM-D Quartz Crystal Microbalance
Light sources for scientific applications
Service
Technical & application support
Team Viewer Online Support for Spectroscopic Ellipsometers
Measurement services
Materials science, spectroscopy & electron microscopy measurements
Magnetometer measurements
Service Parts Quantum Design
News
Latest updates
Product & application news - Spectrum
About us
Our company
Contact
Our partners
Terms & conditions
Privacy policy
ISO 9001
Legal notice
News
Latest updates
Latest updates
NEW: Theta-SE - compact, fast spectral ellipsometer
Quantum Challenge puzzle solved
Light source allrounder
New: Cryogenic Raman microscope for optical table
Hot off the press: Research paper on the new PPMS dilatometer option
OptiCool - New 7 Tesla cryogen-free optical cryostat
Helium recovery news
New web catalog for Quantum Design consumables and spare parts
Short encyclopedia of optical cryostats from Montana Instruments
Van-der-Pauw measurement in PPMS and related instruments with an automated switchbox
1
2
3
»
Event
JEMS Conference
26.08.-30.08.2019
Uppsala, Sweden
Microscopy Conference 2019
01.09.-05.09.2019
TU Berlin, Germany, Booth 37
Conference on Quantum Nanophotonics
01.09.-06.09.2019
Monte Verità, Ascona, Switzerland
PCM-CMM 4th Polish Congress on Mechanics
08.09.-12.09.2019
Krakow, Poland
ECIS Conference of the European Colloid and Interface Society
08.09.-13.09.2019
Leuven, Netherlands
WVASE Online Course
17.09.-03.10.2019 (6 Sessions)
Tweet
